A new type of 3D profiling microscope treats the third dimension, z, as one of the two dimensions in the x,y plane of a focal plane sensor. As observed through a camera in the secondary, the third dimension of a profile is offset across the face of the grating by a displacement proportional to depth. The patented optical magnification feature created by the primary objective hologram is anamorphic, that is, depth readings are magnified at a power independent of the planar dimension. Profile length is determined independently by the field-of-view of the secondary camera and does not narrow as a function of magnification power. This feature recommends this unique approach for push broom inspection applications where one dimension is scanned mechanically through the linear motion of a production line conveyor.